Arizona State University - Optical and X-Ray Characterization
- Offered byCoursera
Optical and X-Ray Characterization at Coursera Overview
Duration | 4 hours |
Start from | Start Now |
Total fee | Free |
Mode of learning | Online |
Official Website | Explore Free Course  |
Credential | Certificate |
Optical and X-Ray Characterization at Coursera Highlights
- Earn a certificate from Arizona State University
- Add to your LinkedIn profile
- November 2023
- 5 quizzes
Optical and X-Ray Characterization at Coursera Course details
- What you'll learn
- Describe the use of light to measure the thickness and refractive index of thin transparent films.
- Explain how light is absorbed and emitted by semiconductors.
- Explain the advantages and limitations of optical and X-ray characterization.
- Optical and X-ray techniques are powerful ways to characterize semiconductor thin films. They can be used to measure film thickness, purity and crystalline quality, and for compositional analysis. Modern techniques are fast, turn-key, and generally non-destructive, allowing for rapid assessment of material properties. This course describes the fundamentals of optical and X-ray characterization and provides real-world examples of how they are used in semiconductor manufacturing.
Optical and X-Ray Characterization at Coursera Curriculum
Course Introduction
Introduction to This Course
Instructor Bio
Course Tips and Video Information
Week 5.1: Reflectance Spectroscopy
5.1.1: Reflectance Spectroscopy
5.1.2: Worked Example
Suggested Reading: Spectral Reflectance (optional)
Check Your Knowledge (CYK)
Week 5.2: Ellipsometry
5.2: Ellipsometry
Suggested Reading: Ellipsometry Tutorial (optional)
Check Your Knowledge (CYK)
Week 5.3: Photoluminescence
5.3: Photoluminescence
Suggested Reading: Fundamentals of Spectroscopy (optional)
Check Your Knowledge (CYK)
Week 5.4: Electron Microprobe X-Ray Analysis
5.4.1: Electron Microprobe X-ray Analysis
5.4.2: Examples of Electron Microprobe Analysis
Check Your Knowledge (CYK)
Week 5.5: Course Wrap-up and Project
Case Study Solution: Electron Microbe Project
Electron Microprobe Analysis of 45 nm MOSFETs
Project Self-reflection
Optical and X-Ray Characterization at Coursera Admission Process
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